Microscopía Conectada
Acelera la toma de decisionesSerie para Microscopía Industrial
170 años de experiencia y capacidades de procesamiento de datos inigualables en todos los dispositivos: con su cartera integral de soluciones de microscopía industrial conectadas y orientadas a aplicaciones, ZEISS te ayudara a convertir los datos en información procesable y a tomar la decisión correcta más rápido.
From micrometer to nanometer
ZEISS delivers a uniquely comprehensive portfolio of all microscope types relevant for industrial applications. This, combined with the correlatable data across the various microscope technologies and the workflow-oriented ZEN core software, provides customers with a complete and coherent solution system that only ZEISS can offer.
![]({"small":"https://images.zeiss.com/metrology/products/systems/microscopy/ims-portfolio-1_5_7.ts-1671545869827.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=c7e7e3a634d2c57319be1dba0132d8db","large":"https://images.zeiss.com/metrology/products/systems/microscopy/ims-portfolio-1_5_7.ts-1671545869827.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=0ffeb6a7055e3cd5d303de4782e0e190","medium":"https://images.zeiss.com/metrology/products/systems/microscopy/ims-portfolio-1_5_7.ts-1671545869827.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=ccbf81c80981a480185bbfd2bb23f2c3","full":"https://images.zeiss.com/metrology/products/systems/microscopy/ims-portfolio-1_5_7.ts-1671545869827.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=9ba55c2af791c9a5b83f266cb5cbf65b"})
![]({"small":"https://images.zeiss.com/metrology/products/systems/microscopy/zeiss-stemi-508.ts-1602073779229.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=234%2C0%2C1440%2C1080&w=640&s=2bc14c30de4f0f432bab64d9bc31e226","large":"https://images.zeiss.com/metrology/products/systems/microscopy/zeiss-stemi-508.ts-1602073779229.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=234%2C0%2C1440%2C1080&w=1280&s=1cff40413866995586fb191fc5b8bdba","medium":"https://images.zeiss.com/metrology/products/systems/microscopy/zeiss-stemi-508.ts-1602073779229.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=234%2C0%2C1440%2C1080&w=832&s=0b086511e12ee164c3626155a364c48a","full":"https://images.zeiss.com/metrology/products/systems/microscopy/zeiss-stemi-508.ts-1602073779229.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=234%2C0%2C1440%2C1080&w=1920&s=4c220cc77a9e0a8e9928a19627c3e637"})
![]({"small":"https://images.zeiss.com/metrology/products/systems/microscopy/ims-portfolio-2_5_7.ts-1671545869720.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=4689b4dfe7eb5fd6efc649c52538d699","large":"https://images.zeiss.com/metrology/products/systems/microscopy/ims-portfolio-2_5_7.ts-1671545869720.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=f6c727e93112adde2c641bb0f48dec35","medium":"https://images.zeiss.com/metrology/products/systems/microscopy/ims-portfolio-2_5_7.ts-1671545869720.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=777930f95e180a81c4c4e60c33fc4dbd","full":"https://images.zeiss.com/metrology/products/systems/microscopy/ims-portfolio-2_5_7.ts-1671545869720.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=b0415baa884f78d18114ae790e4a8cf8"})
![]({"small":"https://images.zeiss.com/metrology/products/systems/microscopy/zeiss_axio_imager_2_new.ts-1671546461046.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=10dae3357b439d8a60e69f3e2bf7a9c8","large":"https://images.zeiss.com/metrology/products/systems/microscopy/zeiss_axio_imager_2_new.ts-1671546461046.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=5d77f0cd2d185b35edc1a5e0876f00cf","medium":"https://images.zeiss.com/metrology/products/systems/microscopy/zeiss_axio_imager_2_new.ts-1671546461046.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=b1f2519ca7e314f923e8661fdfd71360","full":"https://images.zeiss.com/metrology/products/systems/microscopy/zeiss_axio_imager_2_new.ts-1671546461046.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=dc22442b25666152bf789e3baca010eb"})
![]({"small":"https://images.zeiss.com/metrology/products/systems/microscopy/ims-portfolio-3_5_7.ts-1671545869615.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=1ef28422d960597b4426679df8551743","large":"https://images.zeiss.com/metrology/products/systems/microscopy/ims-portfolio-3_5_7.ts-1671545869615.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=03b7ee0274789d01f9229d041b7efd81","medium":"https://images.zeiss.com/metrology/products/systems/microscopy/ims-portfolio-3_5_7.ts-1671545869615.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=39c45213b107cfbf1aa01bf71aec874d","full":"https://images.zeiss.com/metrology/products/systems/microscopy/ims-portfolio-3_5_7.ts-1671545869615.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=ed265573014b44a09d28cd36670a3a99"})
![]({"small":"https://images.zeiss.com/metrology/solutions/medical/medical-plastics/zeiss_axio_imager-2.ts-1638803029579.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=095a693f2efa0c6a3d91e9271648cc4e","large":"https://images.zeiss.com/metrology/solutions/medical/medical-plastics/zeiss_axio_imager-2.ts-1638803029579.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=bd4ce874c7da46b113ad6ec36bb6cfe9","medium":"https://images.zeiss.com/metrology/solutions/medical/medical-plastics/zeiss_axio_imager-2.ts-1638803029579.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=d3a8e9c2954866f7c648e019fcaafadf","full":"https://images.zeiss.com/metrology/solutions/medical/medical-plastics/zeiss_axio_imager-2.ts-1638803029579.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=6b11eae995ea43a2dc88b818d067386e"})
![]({"small":"https://images.zeiss.com/metrology/products/systems/microscopy/ims-portfolio-4_5_7.ts-1671545869491.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=4417e1d59f39c1ad7fb7ad7915bfeb1d","large":"https://images.zeiss.com/metrology/products/systems/microscopy/ims-portfolio-4_5_7.ts-1671545869491.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=7f70b798e1680de2b69824b6625edff0","medium":"https://images.zeiss.com/metrology/products/systems/microscopy/ims-portfolio-4_5_7.ts-1671545869491.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=339eb595c7112ac41542b29d9d9d15c1","full":"https://images.zeiss.com/metrology/products/systems/microscopy/ims-portfolio-4_5_7.ts-1671545869491.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=9df459dafbfc0ed11d32588d324ab6ea"})
![]({"small":"https://images.zeiss.com/metrology/products/systems/microscopy/zeiss-xradia-versa.ts-1602073779869.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=291%2C11%2C1480%2C1111&w=640&s=f3ed18f336c1848ae2e790ddef0c2a20","large":"https://images.zeiss.com/metrology/products/systems/microscopy/zeiss-xradia-versa.ts-1602073779869.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=291%2C11%2C1480%2C1111&w=1280&s=d851612427e35a4ae99c8a1e09f08c7f","medium":"https://images.zeiss.com/metrology/products/systems/microscopy/zeiss-xradia-versa.ts-1602073779869.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=291%2C11%2C1480%2C1111&w=832&s=a0ca35c48049262b9b1236fef4a5d6e0","full":"https://images.zeiss.com/metrology/products/systems/microscopy/zeiss-xradia-versa.ts-1602073779869.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=291%2C11%2C1480%2C1111&w=1920&s=acdce7d37af071c7ee6eedf545a7049f"})
![]({"small":"https://images.zeiss.com/metrology/products/systems/microscopy/ims-portfolio-2_1_5_7.ts-1671546154157.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=16635feec0937a9d93b25eba6e764db6","large":"https://images.zeiss.com/metrology/products/systems/microscopy/ims-portfolio-2_1_5_7.ts-1671546154157.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=b97b30a4e8fb6f299adb2c03180b5b6f","medium":"https://images.zeiss.com/metrology/products/systems/microscopy/ims-portfolio-2_1_5_7.ts-1671546154157.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=a4e97bd9e1a62914b0f8d38dd367b205","full":"https://images.zeiss.com/metrology/products/systems/microscopy/ims-portfolio-2_1_5_7.ts-1671546154157.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=0583a2c841e6874224758cfd394b48e0"})
![]({"small":"https://images.zeiss.com/metrology/products/systems/microscopy/smartproof5/zeiss-evo_neu.ts-1671546689854.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=77fcbb832e60482d7e110a83212e4ac6","large":"https://images.zeiss.com/metrology/products/systems/microscopy/smartproof5/zeiss-evo_neu.ts-1671546689854.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=3999fe3e648a3b7c2d4fd04a517adff4","medium":"https://images.zeiss.com/metrology/products/systems/microscopy/smartproof5/zeiss-evo_neu.ts-1671546689854.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=daaa3d0a46131309535c524251fe5c47","full":"https://images.zeiss.com/metrology/products/systems/microscopy/smartproof5/zeiss-evo_neu.ts-1671546689854.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=ccd7e1104d878374f8b5ee96c15dd322"})
![]({"small":"https://images.zeiss.com/metrology/products/systems/microscopy/ims-portfolio-2_2_5_7.ts-1671546154033.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=afa71891e7517e425458910cb1b9d529","large":"https://images.zeiss.com/metrology/products/systems/microscopy/ims-portfolio-2_2_5_7.ts-1671546154033.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=b2c382861b6911a2dd5182f26d5fa256","medium":"https://images.zeiss.com/metrology/products/systems/microscopy/ims-portfolio-2_2_5_7.ts-1671546154033.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=d6849e9b6ce4a1c1e2b6c03b808541f3","full":"https://images.zeiss.com/metrology/products/systems/microscopy/ims-portfolio-2_2_5_7.ts-1671546154033.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=4e5f60b623d493ef54353d06b81cf003"})
![]({"small":"https://images.zeiss.com/metrology/products/systems/microscopy/zeiss-evo.ts-1602073777121.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=123%2C24%2C1713%2C951&w=640&s=046c66962ebdf975194ba4f874f54fc6","large":"https://images.zeiss.com/metrology/products/systems/microscopy/zeiss-evo.ts-1602073777121.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=123%2C24%2C1713%2C951&w=1280&s=dd1dc67226e88500b5190570510c1b95","medium":"https://images.zeiss.com/metrology/products/systems/microscopy/zeiss-evo.ts-1602073777121.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=123%2C24%2C1713%2C951&w=832&s=6fc88d898946aad7177b4366519793a1","full":"https://images.zeiss.com/metrology/products/systems/microscopy/zeiss-evo.ts-1602073777121.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=123%2C24%2C1713%2C951&w=1920&s=1f75909334862bc454bb7b194727ce5f"})
![]({"small":"https://images.zeiss.com/metrology/products/systems/microscopy/ims-portfolio-2_3_5_7.ts-1671546153932.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=53441e66177b83e87d6ee379abb2280d","large":"https://images.zeiss.com/metrology/products/systems/microscopy/ims-portfolio-2_3_5_7.ts-1671546153932.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=768979ffb7cd00e80c63531c03bcc6be","medium":"https://images.zeiss.com/metrology/products/systems/microscopy/ims-portfolio-2_3_5_7.ts-1671546153932.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=1c37bc93f4f89d9acfa1ebb3a550c325","full":"https://images.zeiss.com/metrology/products/systems/microscopy/ims-portfolio-2_3_5_7.ts-1671546153932.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=7f62c99590fef142023006b60c2554a4"})
![]({"small":"https://images.zeiss.com/metrology/products/systems/microscopy/zeiss-geminisem450.ts-1602073777580.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=156%2C42%2C1633%2C988&w=640&s=98a391a5cefdc31f4af8a8fa67d80d46","large":"https://images.zeiss.com/metrology/products/systems/microscopy/zeiss-geminisem450.ts-1602073777580.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=156%2C42%2C1633%2C988&w=1280&s=705ed6eb295ebe30870a44da336ef7f3","medium":"https://images.zeiss.com/metrology/products/systems/microscopy/zeiss-geminisem450.ts-1602073777580.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=156%2C42%2C1633%2C988&w=832&s=1783d011ada860b919a3c1ba5219d136","full":"https://images.zeiss.com/metrology/products/systems/microscopy/zeiss-geminisem450.ts-1602073777580.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=156%2C42%2C1633%2C988&w=1920&s=726e1f13b39b9c5f9644fe2787f932ce"})
![]({"small":"https://images.zeiss.com/metrology/products/systems/microscopy/ims-portfolio-2_4_7_5.ts-1671546153807.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=b94403a9266c40377d90b52856c55095","large":"https://images.zeiss.com/metrology/products/systems/microscopy/ims-portfolio-2_4_7_5.ts-1671546153807.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=821e955d4fef268b4463cca4ff25ce56","medium":"https://images.zeiss.com/metrology/products/systems/microscopy/ims-portfolio-2_4_7_5.ts-1671546153807.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=d64d315c17c3c8e2d213a17890f4a8c1","full":"https://images.zeiss.com/metrology/products/systems/microscopy/ims-portfolio-2_4_7_5.ts-1671546153807.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=254e315fe4c6693247f47e9f6d433575"})
![]({"small":"https://images.zeiss.com/metrology/products/systems/microscopy/zeiss-crossbeam-550_1.ts-1673280120510.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=b012b7f331c6d1edd6e0776a50e282dd","large":"https://images.zeiss.com/metrology/products/systems/microscopy/zeiss-crossbeam-550_1.ts-1673280120510.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=68ba7f5e9d51e13ebf96a0edc36970e2","medium":"https://images.zeiss.com/metrology/products/systems/microscopy/zeiss-crossbeam-550_1.ts-1673280120510.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=0712cb37b6e530159e5eb5d546e39246","full":"https://images.zeiss.com/metrology/products/systems/microscopy/zeiss-crossbeam-550_1.ts-1673280120510.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=3afaceff05c99b57cd8b3d702a874588"})
Del análisis de imágenes a la productividad
Procesamiento de datos en todas las dimensiones
Con la serie de microscopía industrial, ZEISS ayuda a sus clientes a obtener, gestionar y utilizar sus datos de microscopía de forma coherente en entornos multiusuario, en varios departamentos y en diferentes tipos de microscopía.
Esto permite una operación independiente del usuario, el análisis de tendencias y un conocimiento más profundo a través de la combinación de resultados en todas las dimensiones o modalidades y el intercambio de datos. El resultado: más productividad y mayor certeza en aplicaciones de microscopía industrial.
- Pasa / no pasa para inspección visual
- Identifica defectos o fallas y determinar su causa raíz
- Caracterizar rugosidad y topografía
- Manten un registro de la contaminación por partículas
- Identifica desviaciones en la dimensión geométrica crítica.
Manejo inteligente de datos
para microscopía conectada
La interfaz de usuario unificada de ZEN core permite a los usuarios operar microscopios de la misma manera, desde microscopios estereoscópicos hasta aplicaciones de alta gama totalmente automatizadas. El poderoso paquete de software permite la correlación de microscopía óptica y electrónica en flujos de trabajo multimodales y proporciona conectividad entre sistemas, departamentos y ubicaciones. El núcleo ZEN maneja más que solo imágenes de microscopía. Es el conjunto más completo de herramientas de imagen, segmentación, análisis y conectividad de datos para microscopía multimodal en laboratorios de materiales conectados.
![]({"small":"https://images.zeiss.com/metrology/products/systems/microscopy/zeiss-connected-laboratory.ts-1663661079563.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=9d6f9d04cca366b855dfce89c168ac73","large":"https://images.zeiss.com/metrology/products/systems/microscopy/zeiss-connected-laboratory.ts-1663661079563.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=2f5c6706dd3cd610ad5e523439c6f44b","medium":"https://images.zeiss.com/metrology/products/systems/microscopy/zeiss-connected-laboratory.ts-1663661079563.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=db897015f489bae6dbe9f4675aeb320b","full":"https://images.zeiss.com/metrology/products/systems/microscopy/zeiss-connected-laboratory.ts-1663661079563.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=b09e69da91ff62fcc7014e1ed110b0c4"})
ZEN core enables a workflow-oriented quality assurance for microscopy applications through dedicated
software modules for application fields such as technical cleanliness analysis and job templates for automated image quantification.
ZEN Data Explorer allows access to all data on the central ZEN Data Storage from any place via mobile device or browser.
The central database for secure data handling and documentation offers a scalable central storage solution for results, methods, and templates.
Through its correlative data output, ZEN core allows quick and easy re-localization of area of interests across different imaging methods and microscope technologies.
See how other customers use solutions for Industrial Microscopy from ZEISS
![SPC]({"small":"https://images.zeiss.com/metrology/successtories/2024/spc/zeiss_dsc_5223b_1920x1080.ts-1706016580565.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=603dbf1089bb53ef41cfae3c8eb07da1","large":"https://images.zeiss.com/metrology/successtories/2024/spc/zeiss_dsc_5223b_1920x1080.ts-1706016580565.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=13f9db9ccf230073f24953d4028fbe79","medium":"https://images.zeiss.com/metrology/successtories/2024/spc/zeiss_dsc_5223b_1920x1080.ts-1706016580565.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=94b0f989867ed25934ff93c07bff6575","full":"https://images.zeiss.com/metrology/successtories/2024/spc/zeiss_dsc_5223b_1920x1080.ts-1706016580565.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=dd44a1d742946c228d02ad425ce6c8a4"} "SPC")
![]({"small":"https://images.zeiss.com/metrology/successtories/2024/innio-tca/zeiss_00_innio_zeiss_0715_header_b3_1920x1080.ts-1705055545579.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=79790efa4d72ace3c5808d9378ae2fca","large":"https://images.zeiss.com/metrology/successtories/2024/innio-tca/zeiss_00_innio_zeiss_0715_header_b3_1920x1080.ts-1705055545579.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=e9081ddde8a01e92e6db2a24690b0488","medium":"https://images.zeiss.com/metrology/successtories/2024/innio-tca/zeiss_00_innio_zeiss_0715_header_b3_1920x1080.ts-1705055545579.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=52040079dd3daeb7675f5152ee61550e","full":"https://images.zeiss.com/metrology/successtories/2024/innio-tca/zeiss_00_innio_zeiss_0715_header_b3_1920x1080.ts-1705055545579.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=81b464b2d1b1929d5f5511cc186f082a"})
![]({"small":"https://images.zeiss.com/metrology/successtories/2023/grob-1/grob_metadata.ts-1705415595263.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=55a3fdd75f969a23314fc3aca6c5e0d7","large":"https://images.zeiss.com/metrology/successtories/2023/grob-1/grob_metadata.ts-1705415595263.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=0a567321033a79d2ff690404b5eabf45","medium":"https://images.zeiss.com/metrology/successtories/2023/grob-1/grob_metadata.ts-1705415595263.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=4875a15fbf260aac1962b7a2d7adbabb","full":"https://images.zeiss.com/metrology/successtories/2023/grob-1/grob_metadata.ts-1705415595263.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=d359afc19c03a2c5210800bb5803af81"})
Applications for Industrial Microscopy Systems
Workflow-oriented solutions for efficient quality analysis
ZEISS delivers the broadest range of solutions for industrial applications in various industrial segments: electronics, automotive, aerospace, medical equipment and additive manufacturing. Partner with us to solve your specific technological problems, advance your processes and minimize your time-to-result using our comprehensive microscopy portfolio and targeted software solutions. Achieve high quality imaging with our unique microscopy solutions using light, X-Ray and electron imaging modalities.
![]({"small":"https://images.zeiss.com/metrology/products/systems/microscopy/failure-analysis.ts-1599650246365.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=3f15654498c0ccf6369afee40998cb27","large":"https://images.zeiss.com/metrology/products/systems/microscopy/failure-analysis.ts-1599650246365.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=8cbdae34425daa018fa9ea29b1ecf453","medium":"https://images.zeiss.com/metrology/products/systems/microscopy/failure-analysis.ts-1599650246365.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=719b92ca8f761d9428894823d796046d","full":"https://images.zeiss.com/metrology/products/systems/microscopy/failure-analysis.ts-1599650246365.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=265b83834b48038add1f656ee36551a4"})
Failure Analysis and Metallography
Determining the root cause of failure
The Challenge
Metallography reveals the internal structure of materials. In case something does not go as planned, failure analysis is needed to inspect, analyze, and document the failure to reveal the underlying root cause.
Your benefit with ZEISS
Faster time-to-result through workflow-oriented software and correlation of results with ZEN core.
![]({"small":"https://images.zeiss.com/metrology/products/systems/microscopy/visual-inspection.ts-1599650257967.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=50d0b5d4f2c0c3dc3c787949133941da","large":"https://images.zeiss.com/metrology/products/systems/microscopy/visual-inspection.ts-1599650257967.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=f8fdce404ffd76df8530b7c46ce29d1a","medium":"https://images.zeiss.com/metrology/products/systems/microscopy/visual-inspection.ts-1599650257967.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=57de181557c9016de1eef61ff8f89515","full":"https://images.zeiss.com/metrology/products/systems/microscopy/visual-inspection.ts-1599650257967.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=4a76d4e809a2aa5a2c5d1343072bbdd3"})
Visual Inspection
Fast and repeatable
The Challenge
Optical inspection offers manufacturers the ability to catch and stop errors the moment they appear. It relies on fast and repeatable images and reliable documentation at the shop floor and in quality departments.
Your benefit with ZEISS
ZEISS offers the right microscopy solution for every inspection application: Light microscopes, Scanning electron microscopes and X-Ray microscopes.
![]({"small":"https://images.zeiss.com/metrology/products/systems/microscopy/optical-measurement.ts-1599650247435.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=e1659e5ee7c63b4eca1902eac02fbebe","large":"https://images.zeiss.com/metrology/products/systems/microscopy/optical-measurement.ts-1599650247435.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=045bebfeb30c8cef29d5e1e2e6f627a9","medium":"https://images.zeiss.com/metrology/products/systems/microscopy/optical-measurement.ts-1599650247435.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=29c23adcb4f8c6b22d67688e523c32b4","full":"https://images.zeiss.com/metrology/products/systems/microscopy/optical-measurement.ts-1599650247435.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=ad2f315e738e653295ab47f6e114fbf9"})
Optical Measurement
Precise metrology at a microscopic scale
The Challenge
As production technology progresses, manufacturing tools are able to produce features with ambitious tolerances on work pieces. To assure the quality of these products and components, manufacturers need to measure in dimensions smaller than a human eye can see.
Your benefit with ZEISS
ZEISS’s unmatched experience in microscopy and its extensive know-how in metrology delivers accurate results with a broad range of microscope types.
![]({"small":"https://images.zeiss.com/metrology/products/systems/microscopy/surface-characterization.ts-1599650257626.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=0940e11139565f462671c26ca336a898","large":"https://images.zeiss.com/metrology/products/systems/microscopy/surface-characterization.ts-1599650257626.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=498aa27c743ec15e7d3cc8a4e6cbfc64","medium":"https://images.zeiss.com/metrology/products/systems/microscopy/surface-characterization.ts-1599650257626.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=8af8d1ac9af2232de7ad4be18025f41b","full":"https://images.zeiss.com/metrology/products/systems/microscopy/surface-characterization.ts-1599650257626.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=2cd87a55f0601448b56039058bc64b98"})
Surface Characterization
3D topography and roughness
The Challenge
Finished and functional surfaces with a complex geometry need to be characterized for roughness and three-dimensional topography with highest precision.
Your benefit with ZEISS
Depending on the application requirement, ZEISS can offer tactile options in addition to class-leading microscopy solutions like the ZEISS LSM 900 MAT and ZEISS Smartproof 5.
![]({"small":"https://images.zeiss.com/metrology/products/systems/microscopy/200714_zeiss_tc_horizontal_638.ts-1663660415725.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=b980415277ed4cfed1af3faa60be9dac","large":"https://images.zeiss.com/metrology/products/systems/microscopy/200714_zeiss_tc_horizontal_638.ts-1663660415725.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=9c70eb613063f69a39c450e44835a1d2","medium":"https://images.zeiss.com/metrology/products/systems/microscopy/200714_zeiss_tc_horizontal_638.ts-1663660415725.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=f0a85fd213da1fa531fa19f3763c9fc6","full":"https://images.zeiss.com/metrology/products/systems/microscopy/200714_zeiss_tc_horizontal_638.ts-1663660415725.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=63fa9c121c8be87fb0cc79713ec3b3c4"})
Particle Analysis
Reliable quality assurance for technical cleanliness
The Challenge
The cleanliness of components and parts is at the center of most industrial manufacturing processes. Undiscovered particulate contamination may affect the performance, lifetime, and reliability of final products.
Your benefit with ZEISS
ZEISS enables you to make informed decisions about the root cause of contamination.
Aplicaciones para sistemas de microscopía industrial
Soluciones orientadas al flujo de trabajo para un análisis de calidad eficiente
ZEISS ofrece la gama más amplia de soluciones para aplicaciones industriales en diferentes segmentos industriales: electrónica, automoción, aeronáutica, equipamiento médico y manufactura aditiva. Confíe en nosotros para solucionar sus problemas tecnológicos específicos, avanzar en sus procesos y minimizar el tiempo hasta la obtención de resultados gracias a nuestra completa gama de microscopía y soluciones de software específicas. Consiga imágenes de alta calidad con nuestras soluciones únicas de microscopía que utilizan las modalidades óptica, electrónica y de rayos X para la generación de imágenes.
![]({"small":"https://images.zeiss.com/metrology/products/systems/microscopy/microscopy-appliacations.ts-1595925433804.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=108%2C172%2C1633%2C1226&w=640&s=feef311c12d23e5fd2368a025da8883e","large":"https://images.zeiss.com/metrology/products/systems/microscopy/microscopy-appliacations.ts-1595925433804.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=108%2C172%2C1633%2C1226&w=1280&s=1d46c55a35f5aa2195a240d62ba3228b","medium":"https://images.zeiss.com/metrology/products/systems/microscopy/microscopy-appliacations.ts-1595925433804.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=108%2C172%2C1633%2C1226&w=832&s=5cf17da786f63d8e8e18ef739a0e45b5","full":"https://images.zeiss.com/metrology/products/systems/microscopy/microscopy-appliacations.ts-1595925433804.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=108%2C172%2C1633%2C1226&w=1920&s=4b3dc83f21284a368e64ffcbdf922f61"})
¿Te interesan los equipos de microscopía industrial de ZEISS?
Completa los datos y nos pondremos en contacto contigo para responder tus preguntas.![]({"small":"https://images.zeiss.com/metrology/products/systems/microscopy/connected_microscopy.ts-1671528076830.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=8cf3c36cc5557663a7e1dffb0099dc77","large":"https://images.zeiss.com/metrology/products/systems/microscopy/connected_microscopy.ts-1671528076830.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=457108b8cb67d11ca44a7b8c66862d79","medium":"https://images.zeiss.com/metrology/products/systems/microscopy/connected_microscopy.ts-1671528076830.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=3d59d87d44f1b5b60164cdbd70e26304","full":"https://images.zeiss.com/metrology/products/systems/microscopy/connected_microscopy.ts-1671528076830.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=ee494790b4facc407284af9dbe15f754"})
![]({"small":"https://images.zeiss.com/metrology/digital-article/connected-microscopy/zeiss_mototom.ts-1671471734575.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=cf791240e83a2e229abce4999142e186","large":"https://images.zeiss.com/metrology/digital-article/connected-microscopy/zeiss_mototom.ts-1671471734575.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=c83925c48af450a32eabd814b943b46b","medium":"https://images.zeiss.com/metrology/digital-article/connected-microscopy/zeiss_mototom.ts-1671471734575.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=4902fc7a23506cc807658fa780d660cd","full":"https://images.zeiss.com/metrology/digital-article/connected-microscopy/zeiss_mototom.ts-1671471734575.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=2ad2506fe0a865af3727c19dcbe086fa"})
![]({"small":"https://images.zeiss.com/metrology/digital-article/connected-microscopy/metrotom_800_g3_1500x1500_16_9.ts-1671187741324.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=18860002ff2cc8ce9babfafd7fd3247d","large":"https://images.zeiss.com/metrology/digital-article/connected-microscopy/metrotom_800_g3_1500x1500_16_9.ts-1671187741324.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=16287de50830376b41912437a1854f57","medium":"https://images.zeiss.com/metrology/digital-article/connected-microscopy/metrotom_800_g3_1500x1500_16_9.ts-1671187741324.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=a5d54c6b76ea3bc6273a45810039e593","full":"https://images.zeiss.com/metrology/digital-article/connected-microscopy/metrotom_800_g3_1500x1500_16_9.ts-1671187741324.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=2713a634af15b90935d5a9e40df97bac"})